Bao Rong Chang, Hsiu-Fen Tsai, and Hsiang-Yu Mo, “Ensemble Meta-Learning-Based Robust Chipping Prediction for Wafer Dicing,” Electronics, Vol. 13, Iss. 10, 1802, May 7, 2024. (SCI, EI) (IF=2.9, JCR 2023)
Bao Rong Chang, Hsiu-Fen Tsai, and Hsiang-Yu Mo, “Ensemble Meta-Learning-Based Robust Chipping Prediction for Wafer Dicing,” Electronics, Vol. 13, Iss. 10, 1802, May 7, 2024. (SCI, EI) (IF=2.9, JCR 2023) (NSTC 112-2622-E-390-001 and NSTC 112-2221-E-390-017)
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